Author:
Poindexter D. J.,Stiffler S. R.,Wu P. T.,Agnello P. D.,Ivers T.,Narasimha S.,Faure T. B.,Rankin J. H.,Grosch D. A.,Knox M. D.,Edelstein D. C.,Khare M.,Bronner G. B.,Nam H.-J.,Butt S. A.
Cited by
2 articles.
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1. Mass Transport-Induced Failure;Reliability and Failure of Electronic Materials and Devices;2015
2. Design methods for attaining IBM System z9 processor cycle-time goals;IBM Journal of Research and Development;2007-01