Theory of scanning tunneling microscopy and spectroscopy: Resolution, image and field states, and thin oxide layers-Reference-Cited by-同舟云学术

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Theory of scanning tunneling microscopy and spectroscopy: Resolution, image and field states, and thin oxide layers

Published:1986-09 Issue:5 Volume:30 Page:533-542
ISSN:0018-8646
Container-title:IBM Journal of Research and Development
language:
Short-container-title:IBM J. Res. & Dev.

Author:

Garcia N.

Publisher

IBM

Subject

General Computer Science

Link

http://xplorestaging.ieee.org/ielx5/5288520/5390139/05390154.pdf?arnumber=5390154

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