Author:
Minarno Agus Eko,Soesanti Indah,Nugroho Hanung Adi
Abstract
Batik Nitik is a distinctive form of batik originating from the culturally rich region of Yogyakarta, Indonesia. What sets it apart from other batik styles is its remarkable motif similarity, a characteristic that often poses a considerable challenge when attempting to distinguish one design from another. To address this challenge, extensive research has been conducted with the primary objective of classifying Batik Nitik, and this research leverages an innovative approach combining the microstructure histogram and gray level co-occurrence matrix (GLCM) techniques, collectively referred to as the Microstructure Co-occurrence Histogram (MCH).The MCH method offers a multi-faceted approach to feature extraction, simultaneously capturing color, texture, and shape attributes, thereby generating a set of local features that faithfully represent the intricate details found in Batik Nitik imagery. In parallel, the GLCM method excels at extracting robust texture features by employing statistical measures to portray the subtle nuances within these batik patterns. Nevertheless, the mere fusion of microstructure and GLCM features doesn't inherently guarantee superior classification performance. This research paper has meticulously examined many feature fusion scenarios between microstructure and GLCM to pinpoint the optimal configuration that would yield the most accurate results. The dataset used consists of 960 Batik Nitik samples, comprising 60 categories. The classifiers employed in this study are K-Nearest Neighbor (KNN), Support Vector Machine (SVM), Decision Tree (DT), Naïve Bayes (NB), and Linear Discriminant Analysis (LDA). Based on the experimental results, the fusion of microstructure and GLCM features with the (LDA) classifier yields the best performance compared to other scenarios and classifiers.
Publisher
Society of Visual Informatics
Cited by
2 articles.
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1. Optimization of BatikGAN with Gradient Loss for Enhanced Batik Motif Generation;2024 IEEE 6th Symposium on Computers & Informatics (ISCI);2024-08-10
2. Multi-Stage Vision Transformer for Batik Classification;2024 International Electronics Symposium (IES);2024-08-06