Structural, optical, and electrical properties of chemically sprayed Cu2MnSnS4 thin films

Abstract

In this paper, Cu2MnSnS4 (CMTS) thin films are prepared by chemical spray pyrolysis on glass substrates at a temperature of (400 ± 10°C), using 0.04 M of copper chloride, 0.02 M of manganese chloride, 0.02 M of tin chloride and different concentrations of thiourea (0.14, 0.16, 0.18, 0.20, 0.22, and 0.24 M) as source precursors. XRD diffraction, Raman spectroscopy, FESEM, UV-Vis spectroscopy, and the Hall effect technique were used to examine the structural, morphological, optical, and electrical properties. The results of XRD diffraction show that all films are polycrystalline in nature with tetragonal structure stannite structure. The maximum crystallite size of the CMTS thin films was determined using Scherrer's formula, and it was found to be (12 nm) at (0.20 M) thiourea concentration. The main peak of the Raman spectroscopy data is located at 327 cm-1, which is attributed to the vibration mode originating from the sulfur sub lattice vibration. In the wavelength range of (300-900) nm, optical characteristics such as absorbance and transmittance spectra were measured. With a high absorption coefficient (104 cm-1), the optical energy band gap of the prepared films ranges hand, electrical tests through the Hall effect of CMTS thin films show that they have an electrical conductivity of p-type