Author:
,Allawai M. F.,Sada M. S., ,Jabbar A. M., ,Hussein K. N., ,Habubi N. F., ,Chiad S. S., ,Jadan M., ,
Abstract
Thin films of zinc oxide and (ZnO:Mn) with 1% and 3% concentrations were created at 400 °C by spray pyrolysis. According to X-ray diffraction (XRD) investigation, ZnO films are polycrystalline and have a cubic structure with a distinct peak in one direction (101). The grain size increases as manganese content rise, from 12.66 nm to 14.66 nm. While the strain (ε) for ZnO reduced after manganese doping, it decreased from 27.36 to 23.63. Surface topography and nanostructure study reveal that as the manganese (Mn) content of ZnO films increased, cluster grain size, average roughness, and root mean square roughness (Rrms) all significantly reduced. SEM images show substantial morphological changes from flat islands to spherical nano-grains post-manganese via Mn content. The average transmittance was >70% in the visible area for Undoped ZnO and 1, 3% Manganese doping optical transmittance demonstrates exceptional optical transparency. When doping levels are increased by 1% or 3%, the absorption coefficient rises. The optical band gap widens in ZnO: Mn film for allowed direct transition has been decreased from (3.32 to 3.21) eV. Results illustrate that the films' refractive index and extinction coefficient decreases with increasing Mn Doped. Hydrogen gas decreases resistance in ZnO films, suggesting p-type behavior. Doping with 3% Mn increases resistance. Decreased sensitivity with higher Mn content after hydrogen gas exposure indicates increased electrical resistance in the film.
Publisher
Virtual Company of Physics