Performance analysis of OTFT with varying semiconductor film thickness for future flexible electronics

Abstract

The goal of this study was to get a deeper understanding of the intricate impact of organic semiconductor thickness on the performance of devices, using a thorough and meticulous investigation at the microscopic level incorporating the density of defect model using using Silvaco ATLAS TCAD Simulator. The present work thoroughly investigates the relationship between the thickness of semiconductors and important performance parameters, such as hole concentration, electric potential, electric field, and Hole QFL. The comprehensive insights derived from this research not only enhance the comprehension of device physics but also provide a framework for the systematic enhancement of electronic devices. The widespread use of organic thin film transistors (OTFT) in future Flexible electronics, particularly in display and memory circuits, necessitates the incorporation of low voltage, high speed, and low cost characteristics.