Study and Characterization of LiF Thin Film Combined with a Silicon Detector for Neutron Metrology-Reference-Cited by-同舟云学术

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Study and Characterization of LiF Thin Film Combined with a Silicon Detector for Neutron Metrology

Published:2023-05 Issue:5 Volume:143 Page:400-413
ISSN:1898-794X
Container-title:Acta Physica Polonica A
language:
Short-container-title:Acta Phys. Pol. A

Author:

Brahimi H.¹,Keffous A.²,Haine N.³,Rahal B.¹,Larbah Y.¹

Affiliation:

1. Nuclear Research Center of Algiers, 02, Boulevard Frantz Fanon, BP 399, 16038, Algiers, Algeria

2. Research Center in Semiconductors Technology for Energy (CRTSE), 02, Bd. Dr. Frantz Fanon, B.P. 140, 7 Merveilles, 16038, Algiers, Algeria

3. Faculty of Physics, University of Sciences and Technology - Houari Boumedienne (USTHB), BP 32, Bab Ezzouar, 16111, Algiers, Algeria

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

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