Electrical Characterization of Al/Ta2O5/Al Structures Grown by Electron Beam Deposition-Reference-Cited by-同舟云学术

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Electrical Characterization of Al/Ta2O5/Al Structures Grown by Electron Beam Deposition

Published:2014-05 Issue:5 Volume:125 Page:1191-1196
ISSN:0587-4246
Container-title:Acta Physica Polonica A
language:en
Short-container-title:Acta Phys. Pol. A

Author:

Yahia I.S.¹²,Farag A.A.M.³

Affiliation:

1. Department of Physics, Center of Excellent for Advanced Materials Research, Faculty of Science, King Khalid University, P.O. Box 9004, Abha, Saudi Arabia

2. Nano-Science & Semiconductor Labs., Physics Department, Faculty of Education, Ain Shams University Roxy, Cairo, Egypt

3. Thin Film Laboratory, Department of Physics, Faculty of Education, Ain Shams University, Roxy, Cairo, Egypt

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

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