Interference Fringes in the Plane Wave Topographic Images of Growth Bands in Si:Ge-Reference-Cited by-同舟云学术

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Interference Fringes in the Plane Wave Topographic Images of Growth Bands in Si:Ge

Published:2002-05 Issue:5 Volume:101 Page:729-734
ISSN:0587-4246
Container-title:Acta Physica Polonica A
language:en
Short-container-title:Acta Phys. Pol. A

Author:

Wieteska K.¹,Wierzchowski W.²,Graeff W.³,Lefeld-Sosnowska M.⁴,Regulska M.⁴

Affiliation:

1. Institute of Atomic Energy, 05-400 Otwock-Świerk, Poland

2. Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

3. HASYLAB at DESY, Notkestrasse 85, 22603 Hamburg, Germany

4. Institute of Experimental Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Synchrotron Diffraction topography in Studying of the Defect Structure in Crystals Grown by the Czochralski Method;Acta Physica Polonica A;2013-08

2. Synchrotron X-ray investigation of La0.3Sr0.7Al0.65Ta0.35O3 crystals;Crystal Research and Technology;2005-04

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