Raman Spectroscopy for the Analysis οf Temperature-Dependent Plastic Relaxation οf SiGe Layers-Reference-Cited by-同舟云学术

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Raman Spectroscopy for the Analysis οf Temperature-Dependent Plastic Relaxation οf SiGe Layers

Published:2009-07 Issue:1 Volume:116 Page:78-80
ISSN:0587-4246
Container-title:Acta Physica Polonica A
language:en
Short-container-title:Acta Phys. Pol. A

Author:

Pezzoli F.¹,Bonera E.²,Bollani M.²,Sanguinetti S.²,Grilli E.²,Guzzi M.²,Isella G.³,Chrastina D.³,von Känel H.³

Affiliation:

1. Institute for Integrative Nanosciences, IFW-Dresden, Helmholtzstr. 20, D-0169 Dresden, Germany

2. L-NESS, Dipartimento di Scienza dei Materiali della Università degli Studi di Milano-Bicocca, Via Cozzi 53, I-20125 Milano, Italy

3. L-NESS, Dipartimento di Fisica del Politecnico di Milano, Via Anzani 42, I-22100, Como, Italy

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

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