Characterization of New Structure for Silicon Carbide X-Ray Detector by Method Monte Carlo-Reference-Cited by-同舟云学术

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Characterization of New Structure for Silicon Carbide X-Ray Detector by Method Monte Carlo

Published:2011-08 Issue:2 Volume:120 Page:252-255
ISSN:0587-4246
Container-title:Acta Physica Polonica A
language:en
Short-container-title:Acta Phys. Pol. A

Author:

Stankovic S.J.¹,Ilic R.D.¹,Jankovic K.S.²,Vasic-Milovanovic A.³,Loncar B.⁴

Affiliation:

1. Vinča Institute of Nuclear Sciences, Belgrade, Serbia

2. Institute for testing materials-IMS, Belgrade, Serbia

3. Faculty of Mechanical Engineering, University of Belgrade, Belgrade, Serbia

4. Faculty of Technology and Metallurgy, University of Belgrade, Belgrade, Serbia

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Monte Carlo Analysis of the Influence of Different Packaging on MOSFET Energy Response to X-rays and Gamma Radiation;Acta Physica Polonica A;2012-10

2. Atomic spectrometry update—X-ray fluorescence spectrometry;Journal of Analytical Atomic Spectrometry;2012

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