Optical and Electrical Characterization of (002)-Preferentially Oriented n-ZnO/p-Si Heterostructure-Reference-Cited by-同舟云学术

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Optical and Electrical Characterization of (002)-Preferentially Oriented n-ZnO/p-Si Heterostructure

Published:2015-09 Issue:2 Volume:128 Page:283-289
ISSN:0587-4246
Container-title:Acta Physica Polonica A
language:en
Short-container-title:Acta Phys. Pol. A

Author:

Abdallah B.¹,Al-Khawaja S.¹

Affiliation:

1. Department of Physics, Atomic Energy Commission of Syria, P.O. Box 6091, Damascus, Syria

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

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2. Study of electron band structure of Pr doped ZnAl2O4 by reducing background in modified-CDB-spectroscopy;Radiation Physics and Chemistry;2023-05

3. Study of birefringence inside nanocrystalline Zinc Oxide thin films using terahertz spectroscopy;Optical Materials;2022-11

4. Comparative structural and optical studies of Al-/Sn-doped ZnO-textured films for optoelectronic application;Journal of Materials Science: Materials in Electronics;2022-05-10

5. Structural and electrical study of BLT thin film deposited on different substrates by electron gun evaporation;World Journal of Engineering;2021-07-05

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