XPS Study of Te-protected Surface of Sn1-xMnxTe Topological Crystalline Insulator-Reference-Cited by-同舟云学术

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XPS Study of Te-protected Surface of Sn1-xMnxTe Topological Crystalline Insulator

Published:2018-10 Issue:4 Volume:134 Page:937-940
ISSN:1898-794X
Container-title:Acta Physica Polonica A
language:
Short-container-title:Acta Phys. Pol. A

Author:

Demchenko I.N.¹,Syryanyy Y.²,Zięba M.¹,Minikayev R.¹,Łusakowska E.¹,Wiater M.¹,Konstantynov P.¹,Wojtowicz T.³,Story T.¹

Affiliation:

1. Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

2. Faculty of Chemistry, Biological and Chemical Research Centre UW, Żwirki i Wigury 101, PL-02689 Warsaw, Poland

3. International Research Centre MagTop, Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, PL-02668 Warsaw, Poland

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface chemical treatment effect on (1 1 1) PbSnTe < In > Topological crystalline insulator films;Applied Surface Science;2021-12

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