X-Ray Characterization of GaAs:Zn Gas-transport Grown Whiskers Using Conventional and Synchrotron Sources-Reference-Cited by-同舟云学术

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X-Ray Characterization of GaAs:Zn Gas-transport Grown Whiskers Using Conventional and Synchrotron Sources

Published:1997-05 Issue:5 Volume:91 Page:997-1002
ISSN:0587-4246
Container-title:Acta Physica Polonica A
language:en
Short-container-title:Acta Phys. Pol. A

Author:

Paszkowicz W.¹,Górecka J.¹,Domagała J.¹,Dmitruk N.²,Varshava S.S.³,Härtwig J.⁴,Ohler M.⁴,Pietraszko A.⁵

Affiliation:

1. Institute of Physics, Polish Academy of Sciences, Al. Lotników 32/46, 02-668 Warsaw, Poland

2. Institute for Physics of Semiconductors, National Academy of Sciences, Kiev, Ukraine

3. State University of Technology, 290648 Lviv, Ukraine

4. European Synchrotron Radiation Facility, 38043 Grenoble, France

5. Institute of Low Temperatures and Structural Research, Okólna 2, Wrocław, Poland

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

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