Raman Characterisation of Cd1-xZnx Te Thick Polycrystalline Films Obtained by the Close-Spaced Sublimation-Reference-Cited by-同舟云学术

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Raman Characterisation of Cd1-xZnx Te Thick Polycrystalline Films Obtained by the Close-Spaced Sublimation

Published:2017-10 Issue:4 Volume:132 Page:1430-1435
ISSN:0587-4246
Container-title:Acta Physica Polonica A
language:en
Short-container-title:Acta Phys. Pol. A

Author:

Znamenshchykov Y.V.¹,Kosyak V.V.¹,Opanasyuk A.S.¹,Dorda V.O.¹,Fochuk P.M.²,Medvids A.³

Affiliation:

1. Sumy State University, 2, Rymsky Korsakov Str., 40007 Sumy, Ukraine

2. Chernivtsi National University, 2, Kotsiubynskogo Str., Chernivtsi, Ukraine

3. Riga Technical University, 3 Paula Valdena Str., LV-1048, Riga, Latvia

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The Growth Pits Filling Mechanism of CdZnTe Epitaxial Film Prepared by Close-Spaced Sublimation Based on the First-Principles Calculation;Journal of Crystal Growth;2023-09

2. Morphology-property relationships of CdZnTe films prepared via radio frequency magnetron sputtering;Thin Solid Films;2023-03

3. Raman study of Cd1−xZnxTe phonons and phonon–polaritons—Experiment and ab initio calculations;Journal of Applied Physics;2023-02-08

4. Resistance characteristics of CdZnTe films with structure of Cu/CdZnTe/ITO and Cu/CdZnTe/Cu;Applied Physics A;2022-01-13

5. Combinatorial study of the structural, optical, and electrical properties of low temperature deposited Cd1-Zn Te (0 ≤ x ≤ 1) thin films by MOCVD;Applied Surface Science;2021-02

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