Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions-Reference-Cited by-同舟云学术

Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions

Published:2020-01 Issue:1 Volume:137 Page:38-43
ISSN:1898-794X
Container-title:Acta Physica Polonica A
language:
Short-container-title:Acta Phys. Pol. A

Author:

Stachura R.¹,Kubala-Kukuś A.¹²,Banaś D.¹²,Stabrawa I.¹²,Szary K.¹²,Jagodziński P.¹,Aquilanti G.³,Božičević Mihalić I.⁴,Pajek M.¹,Semaniak J.¹,Teodorczyk M.⁵

Affiliation:

1. Institute of Physics, Jan Kochanowski University, Świętokrzyska 15, 25-406 Kielce, Poland

2. Holycross Cancer Center, S. Artwińskiego 3, 25-734 Kielce, Poland

3. Elettra - Sincrotrone Trieste, s.s. 14, km 163.5 in Area Science Park, 34149 Basovizza, Trieste, Italy

4. Rudjer Boskovic Institute, Bijenicka cesta 54, 10000 Zagreb, Croatia

5. Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warszawa, Poland

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

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1. Analysis of Ti nanolayers irradiated with Xeq＋ ions using synchrotron radiation based X-ray reflectometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2023-03

2. Surface and subsurface damage in 14 MeV Au ion-irradiated diamond;Journal of Applied Physics;2021-09-14

3. Low-Angle X-Ray Spectroscopy and Reflectometry Techniques in Interdisciplinary Applications;Acta Physica Polonica A;2021-03