Angle Resolved Scattering Combined with Optical Profilometry as Tools in Thin Films and Surface Survey-Reference-Cited by-同舟云学术

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Angle Resolved Scattering Combined with Optical Profilometry as Tools in Thin Films and Surface Survey

Published:2015-07 Issue:1 Volume:128 Page:81-86
ISSN:0587-4246
Container-title:Acta Physica Polonica A
language:en
Short-container-title:Acta Phys. Pol. A

Author:

Marszałek K.¹,Wolska N.²³,Jaglarz J.²

Affiliation:

1. AGH University of Science and Technology, al. A. Mickiewicza 30, 30-059 Krakow, Poland

2. Institute of Physics, Cracow University of Technology, Podchorążych 1, 30-084 Kraków, Poland

3. Elkom Trade S.A., Targowa 21, 27-400 Ostrowiec Świętokrzyski, Poland

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

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