X-ray Topographic Investigations of Domain Structure in Czochralski Grown PrxLa1-xAlO3Crystals-Reference-Cited by-同舟云学术

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X-ray Topographic Investigations of Domain Structure in Czochralski Grown PrxLa1-xAlO3Crystals

Published:2010-02 Issue:2 Volume:117 Page:268-271
ISSN:0587-4246
Container-title:Acta Physica Polonica A
language:en
Short-container-title:Acta Phys. Pol. A

Author:

Wieteska K.¹,Wierzchowski W.²,Malinowska A.²,Turczyński S.²,Lefeld-Sosnowska M.³,Pawlak D.A.²,Łukasiewicz T.²,Graeff W.⁴

Affiliation:

1. Institute of Atomic Energy POLATOM, 05-400 Otwock-Świerk, Poland

2. Institute of Electronic Materials Technology, Wólczyńska 133, 01-919 Warsaw, Poland

3. Institute of Experimental Physics, University of Warsaw, Hoża 69, 00-681 Warsaw, Poland

4. HASYLAB at DESY, Notkestr. 85, 22-603 Hamburg, Germany

Publisher

Institute of Physics, Polish Academy of Sciences

Subject

General Physics and Astronomy

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Synchrotron Diffraction topography in Studying of the Defect Structure in Crystals Grown by the Czochralski Method;Acta Physica Polonica A;2013-08

2. Synchrotron Topographic Studies of Domain Structure in Czochralski Grown PrxLa1-xAlO3and PrxLa1-x-yMgyAlO3Crystals;Acta Physica Polonica A;2012-04

3. Czochralski Crystal Growth, Thermal Conductivity, and Magnetic Properties of PrxLa1−xAlO3, where x = 1, 0.75, 0.55, 0.40, 0;Crystal Growth & Design;2011-02-21

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