Abstract
In present paper we propose easy way to implement method of interfering vortices with opposite topological charge for the real time determination of the thickness and information about the surface of studied samples with the resolution up to 7 nanometers. The determination of the characteristics of the medial cross-section of submicron-objects becomes possible due to phase sensitivity of interfering singular beams to the slightest changes in the optical path difference between them. The dependence of rotational angle of resulting interference pattern in case of different sample thickness for two singular beams superposition is considered in detail.
Funder
Российский Фонд Фундаментальных Исследований
Foundation for Assistance to Small Innovative Enterprises in Science and Technology
Publisher
Samara State National Research University
Subject
Electrical and Electronic Engineering,Computer Science Applications,Atomic and Molecular Physics, and Optics
Cited by
4 articles.
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