DETERMINATION OF ORGANIC CONTAMINANTS CONCENTRATION ON THE SILICA SURFACE BY LATERAL FORCE MICROSCOPY-Reference-Cited by-同舟云学术

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DETERMINATION OF ORGANIC CONTAMINANTS CONCENTRATION ON THE SILICA SURFACE BY LATERAL FORCE MICROSCOPY

Published:2016-01-01 Issue:6 Volume:40 Page:837-843
ISSN:2412-6179
Container-title:Computer Optics
language:
Short-container-title:Kompʹût. opt.

Author:

Ivliev N. A.,Kolpakov V. A.,Krichevskiy S. V.

Publisher

Samara State National Research University

Subject

Electrical and Electronic Engineering,Computer Science Applications,Atomic and Molecular Physics, and Optics

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The use of atomic force microscopy to assess the quality of cleaning and tribometric properties of a silicon wafer surface;Computer Optics;2019-06

2. Determination of Concentration of Organic Contaminants on a Silicon Dioxide Surface by Tribometry;Measurement Techniques;2017-12

3. The necessary bound of rectangle’s square for packing into this any system of five and more than five finite quantity squares with total area 1;Procedia Engineering;2017

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