Integrating spotted hyena optimization technique with generative artificial intelligence for time series forecasting

Abstract

AbstractGenerative artificial intelligence (AI) has developed as an effective tool for time series predicting, revolutionizing the typical methods of prediction. Different classical approaches that depend on existing approaches and assumptions, generative AI controls advanced deep learning (DL) approaches like generative adversarial networks (GANs) and recurrent neural networks (RNNs), to identify designs and connections in time series data. DL has accomplished major success in optimizing performances connected with AI. In the financial area, it can be extremely utilized for the stock market predictive, trade implementation approaches, and set of optimizers. Stock market predictive is the most important use case in this field. GANs with advanced AI approaches have become more significant in recent times. However, it can be utilized in image‐image‐translation and other computer vision (CV) conditions. GANs could not utilized greatly for stock market prediction because of their effort to establish the proper set of hyperparameters. This study develops an integrated spotted hyena optimization algorithm with generative artificial intelligence for time series forecasting (SHOAGAI‐TSF) technique. The purpose of the SHOAGAI‐TSF technique is to accomplish a forecasting process for the utilization of stock price prediction. The SHOAGAI‐TSF technique uses probabilistic forecasting with a conditional GAN (CGAN) approach for the prediction of stock prices. The CGAN model learns the data generation distribution and determines the probabilistic prediction from it. To boost the prediction results of the CGAN approach, the hyperparameter tuning can be performed by the use of the SHOA. The simulation result analysis of the SHOAGAI‐TSF technique takes place on the stock market dataset. The experimental outcomes determine the significant solution of the SHOAGAI‐TSF algorithm with other compared methods in terms of distinct metrics.