Transmission electron microscopy study of extended defect evolution and amorphization in SiC under Si ion irradiation
Author:
Affiliation:
1. Université Paris‐SaclayCEAService de Recherches Métallurgiques Appliquées Gif‐sur‐Yvette France
Publisher
Wiley
Subject
Materials Chemistry,Ceramics and Composites
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1111/jace.17595
Reference66 articles.
1. Properties of Silicon Carbide for Nuclear Fuel Particle Coatings
2. Fuel development for gas-cooled fast reactors
3. Prospects for SiC electronics and sensors
4. Characterization of defects in silicon carbide by Raman spectroscopy
5. Effect of van der Waals interactions on the stability of SiC polytypes
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