One-step deposition of nano-to-micron-scalable, high-quality digital image correlation patterns for high-strainin-situmulti-microscopy testing-Reference-Cited by-同舟云学术

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One-step deposition of nano-to-micron-scalable, high-quality digital image correlation patterns for high-strainin-situmulti-microscopy testing

Published:2019-08-30 Issue:6 Volume:55 Page:e12330
ISSN:0039-2103
Container-title:Strain
language:en
Short-container-title:Strain

Author:

Hoefnagels J.P.M.¹^ORCID,van Maris M.P.F.H.L.¹,Vermeij T.¹^ORCID

Affiliation:

1. Department of Mechanical Engineering; Eindhoven University of Technology; Eindhoven The Netherlands

Funder

Partnership Program of the Materials innovation institute

Netherlands Organization for Scientific Research

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/str.12330/fullpdf

Reference56 articles.

1. M. A. , Sutton 2008 Digital image correlation for shape and deformation measurements. Springer handbook of experimental solid mechanics 565 600

2. Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review

3. On image gradients in digital image correlation

4. Large Field Digital Image Correlation Used for Full-Scale Aircraft Crash Testing: Methods and Results

5. Bridge Deflection Measurement Using Digital Image Correlation with Camera Movement Correction

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