Effect of the sample annealing temperature and sample crystallographic orientation on the charge kinetics of MgO single crystals subjected to keV electron irradiation
Author:
Affiliation:
1. LaMaCoP, Université de Sfax pour le sud; Faculté des Sciences; Sfax Tunisie
2. CEA, DAM; GRAMAT; Gramat France
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12217/fullpdf
Reference19 articles.
1. Time-dependent measurement of the trapped charge in electron irradiated insulators: application to Al2O3-sapphire;Belhaj;J. Appl. Phys.,2000
2. Charge dynamics of MgO single crystals subjected to keV electron irradiation;Boughariou;J. Appl. Phys.,2004
3. Effect of current density on electron beam induced charging in MgO;Boughariou;Nucl. Instr. Meth. Phys. Res. B,2005
4. Braga , D. Blaise , G. 2001 Charge trapping effect induced secondary electron emission variation CSC’4 Proceeding
5. Dynamic investigation of electron trapping and charge decay in electron-irradiated Al2O3 in a scanning electron microscope: methodology and mechanisms” Nucl.Instrum;Fakhfakh;Methods Phys. Res. B.,2002
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1. Analytical model of secondary electron emission yield in electron beam irradiated insulators;Micron;2018-09
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