Focused ion beam preparation of microbeams for in situ mechanical analysis of electroplated nanotwinned copper with probe type indenters-Reference-Cited by-同舟云学术

Focused ion beam preparation of microbeams for in situ mechanical analysis of electroplated nanotwinned copper with probe type indenters

Author:

ROBERTSON STUART¹²^ORCID,DOAK SCOTT¹,SUN FU‐LONG³,LIU ZHI‐QUAN³⁴^ORCID,LIU CHANGQING²^ORCID,ZHOU ZHAOXIA¹^ORCID

Affiliation:

1. Department of MaterialsLoughborough Materials Characterisation Centre, Loughborough University Loughborough U.K.

2. Wolfson School of Mechanical, Electrical and Manufacture EngineeringLoughborough University Loughborough LE11 3TU U.K.

3. Institute of Metal ResearchChinese Academy of Sciences Shenyang P.R. China

4. Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institutes of Advanced TechnologyChinese Academy of Sciences Shenzhen P.R. China

Funder

Engineering and Physical Sciences Research Council

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

Reference19 articles.

2. Fabrication and characterization of electroplated nanotwinned‐copper films on polymer substrates;Chang L.;(IMPACT‐IAAC 2016),2016

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