A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope-Reference-Cited by-同舟云学术

A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope

Published:1974-01 Issue:1 Volume:100 Page:93-98
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Lodder J. C.,Berg K. G. v.d.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1974.tb03916.x/fullpdf

Reference12 articles.

1. Indexing polycrystalline and single-crystal patterns

2. Problems of precision and accuracy in measurement of electron diffraction patterns;Beu;Spec. tech. Publs. Am. Soc. Test. Mater.,1962

3. An investigation of superconducting materials in a high voltage electron microscope;Goringe;Proc. Fourth Eur. Reg. Conf. Electron Microsc., Rome,1968

4. The lattice constants and expansion coefficients of some halides;Hambling;Acta Crystallogr.,1953

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