Procedures for focusing, stigmating and alignment in high resolution electron microscopy-Reference-Cited by-同舟云学术

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Procedures for focusing, stigmating and alignment in high resolution electron microscopy

Published:1983-05 Issue:2 Volume:130 Page:187-201
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Saxton W. O.,Smith David J.,Erasmus S. J.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1983.tb04217.x/fullpdf

Reference37 articles.

1. Resolution estimation in electron microscopy;Al-Ali;Optik,1980

2. Modulation transfer function and detective quantum efficiency of Electrotitus;Beorchia;Optik,1980

3. On-line image processing in high resolution electron microscopy;Boyes;J. Microsc.,1982

4. Wirkungsquerschnitte fur elastische und unelastische Elektronenstreuung an amorphen Kohlenstoff- und Germaniumschichten;Brunger;Z. Physik,1965

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