Limitations in the X-ray microanalysis of thin foils in a scanning transmission electron microscope
Author:
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1977.tb00021.x/fullpdf
Reference17 articles.
1. Quantitative analysis of thin specimens;Cliff;J. Microsc.,1975
2. Microanalysis across grain boundaries in aluminium alloys;Doig;Phil. Mag.,1975
3. Doig , P. Flewitt , P.E.J. Edington , J.W. 1977 The stress corrosion susceptibility of 7075 Al-Zn-Mg-Cu alloys tempered from T6 to T7X Corrosion
4. Enhanced X-ray emission from extinction contours in a single crystal gold film;Duncumb;Phil. Mag.,1962
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1. Enhanced control of electropolishing for the preparation of thin foils for TEM: Artificial and multiple - phase micro-electropolishing;Proceedings, annual meeting, Electron Microscopy Society of America;1996-08-11
2. Report on the 1993 and 1994 Round Robin EDXS Tests of the Ile de France TEM Network;Microscopy Microanalysis Microstructures;1995
3. Solute-enriched surface layers and X-ray microanalysis of thin foils of a commercial aluminium alloy;Journal of Microscopy;1992-02
4. The parameterless correction method in X-ray microanalysis;Microscopy Microanalysis Microstructures;1990
5. Quantitative X-ray microanalysis of thin specimens in the transmission electron microscope; a review;Mineralogical Magazine;1987-03
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