Theoretical calculation of probe size of low-voltage scanning electron microscopes-Reference-Cited by-同舟云学术

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Theoretical calculation of probe size of low-voltage scanning electron microscopes

Published:1993-05 Issue:2 Volume:170 Page:119-124
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

XIMEN J.,SHAO Z.,LIN P. S. D.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1993.tb03330.x/fullpdf

Reference39 articles.

1. Low voltage electron microscopy-how low;Barth;Ultramicroscopy,1976

2. Very low voltage electron microscopy;Crewe;Ultramicroscopy,1976

3. Towards the ultimate scanning electron microscopy;Crewe;Scanning Electron Microsc.,1985

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Modeling SEM Column, Probe Formation, and Imaging Using Fourier Optics;Microscopy and Microanalysis;2021-07-30

2. Electron Optics of a Scanning Electron Microscope;Springer Series in Optical Sciences;1998

3. Fine Imaging Scanning Electron Microscope due to Secondary Electron Multiplication and Optical Configuration;Japanese Journal of Applied Physics;1997-06-15

4. Theory and computation for imaging in scanning transmission microscopy considering partial coherence in illumination;Ultramicroscopy;1994-10

5. Electron optical design of a high‐resolution low‐voltage scanning electron microscope with field emission gun;Review of Scientific Instruments;1993-10

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