Optoelectronic detector probes for scanning near-field optical microscopy
Author:
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1994.tb03525.x/fullpdf
Reference10 articles.
1. Collection mode near-field optical microscopy;Betzig;Appl. Phys. Lett.,1987
2. Near-field optics: microscopy, spectroscopy, and surface modification beyond the diffraction limit;Betzig;Science,1992
3. Near-field photodetection optical microscopy (NPOM): a novel probe for optical characterization on a subwavelength scale;Busath;SPIE.,1993
4. The Concept of an Optoelectronic Probe for Near Field Microscopy
5. Scanning near-field optoelectronic microscopy (SNOEM): a novel approach to near-field microscopy;Danzebrink;Ultramicroscopy,1994
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Optical dipole model for photodetection in the near field;Journal of the Optical Society of America A;2001-07-01
2. Scanning Near-Field Optical Microscopy;Scanning Probe Microscopy;1998
3. Image formation in near-field optics;Progress in Surface Science;1997-11
4. Optical intensity mapping on the nanometer scale by near-field photodetection optical microscopy;Optics Letters;1996-04-01
5. Fabrication and characterization of optoelectronic near-field probes based on an SFM cantilever design;Ultramicroscopy;1995-12
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