A generalization of atom location by channelling enhanced microanalysis-Reference-Cited by-同舟云学术

A generalization of atom location by channelling enhanced microanalysis

Published:1984-10 Issue:1 Volume:136 Page:97-101
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Krishnan Kannan M.,Thomas Gareth

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1984.tb02549.x/fullpdf

Reference8 articles.

1. Über Extinktionsdiagramme von Quarz;Borrmann;Phys. Z.,1941

2. Crystallographic orientation effects in energy dispersive X-ray analysis;Bourdillon;Phil. Mag.,1981

3. The derivation of structural information from absorption effects in X-ray diffraction;Cowley;Acta Cryst.,1964

4. Structure information from anomalous absorption effects in diffuse scattering of electrons;Gjønnes;Acta Cryst.,1971

5. Krishnan , K.M. 1984 Determination of specific site occupations in single crystals by channelling enhanced microanalysis: principles and applications Ph.D. thesis

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2. Atomistic modeling of quaternary alloys: Ti and Cu in NiAl;Metallurgical and Materials Transactions B;2002-04

3. Channeling Enhanced Microanalysis;Encyclopedia of Materials: Science and Technology;2001

4. The ordering tie-line method for sublattice occupancy in intermetallic compounds;Philosophical Magazine A;1996-09

5. A new approach to alchemi: the ordering tie line method;Proceedings, annual meeting, Electron Microscopy Society of America;1995-08-13