High resolution electron microscope observations of microstructures in A15 type Nb3X superconductors-Reference-Cited by-同舟云学术

High resolution electron microscope observations of microstructures in A15 type Nb3X superconductors

Published:1988-08 Issue:2 Volume:151 Page:147-157
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Takeda M.,Yoshida H.,Endoh H.,Hashimoto H.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1988.tb04621.x/fullpdf

Reference15 articles.

1. Arita , M. Nissen , H.-U. Schauer , W. 1986 Planar defects in Nb 3 Ge and hexagonal Nb 5 Ge 3 Proc. 11th Int. Congr. on Electron Microscopy 861 862

2. Hashimoto , H. Endoh , H. Honda , T. Harada , Y. Sakurai , S. Etoh , T. 1983 Construction of a 400 kV analytical atom resolution electron microscope (AARM) Proc. 8th Int. Conf. HVEM 15 20

3. Construction and application of a 400 kV analytical atom resolution electron microscope;Hashimoto;J. Electron Microsc. Tech.,1986

4. High resolution electron microscopy of Nb3Sn and its defects;Kitano;Cryogenics,1982

5. Electron-microscopic structure images of Nb3Sn from multi-filament superconductors. Rapport de la réunion d'automne de la Soc;Nissen;Suisse de Phys.,1981

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