A simple method of measuring the thickness of semi-thin and ultra-thin sections-Reference-Cited by-同舟云学术

A simple method of measuring the thickness of semi-thin and ultra-thin sections

Published:1987-10 Issue:1 Volume:148 Page:107-111
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Bedi K. S.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1987.tb02858.x/fullpdf

Reference12 articles.

1. Disctribution-free estimation of sphere size distributions from slabs showing over-projection and truncation, with a review of previous methods;Cruz-Orive;J. Microsc.,1982

2. Particle number can be estimated using a disector of unknown thickness: the selector;Cruz-Orive;J. Microsc.,1987

3. Accuracy and precision of a scanning and integrating microinterferometer;Goldstein;J. Microsc.,1974

4. Stereology of arbitrary particles;Gundersen;J. Microsc.,1986

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