The comparison of transition metal concentration ratios determined by EELS and EDX-Reference-Cited by-同舟云学术

The comparison of transition metal concentration ratios determined by EELS and EDX

Published:1987-04 Issue:1 Volume:146 Page:1-16
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Crozier P. A.,Chapman J. N.,Craven A. J.,Titchmarsh J. M.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1987.tb01322.x/fullpdf

Reference38 articles.

1. Inner shell edge profiles in electron energy loss spectroscopy;Ahn;Ultramicroscopy,1985

2. Crystallographic orientation effects in energy dispersive x-ray analysis;Bourdillon;Phil. Mag. A,1981

3. Understanding thin film x-ray spectra;Chapman;J. Microsc.,1984

4. Chapman , J.N. Steele , J.D. Paterson , J.H. Titchmarsh , J.M. 1985 The separation of characteristic signals from complex EELS spectra Electron Microscopy and Analysis 1985 177

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