Segregation-induced hole drilling at grain boundaries-Reference-Cited by-同舟云学术

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Segregation-induced hole drilling at grain boundaries

Published:1995-12 Issue:3 Volume:180 Page:300-306
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

ÖZKAYA D.,YUAN J.,BROWN L. M.,FLEWITT P. E. J.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1995.tb03689.x/fullpdf

Reference9 articles.

1. 100 keV electron beam damage of metals, ceramics and semiconductors-implications for microanalysis and nano-lithography;Humphreys;Inst. Phys. Conf. Ser.,1991

2. Macaulay , J.M. 1989 The production of nanometer structures in inorganic materials by electron beams of high current density PhD thesis University of Cambridge

3. Parallel EELS CCD detector for a VG HB501 STEM;McMullan;Inst. Phys. Conf. Ser.,1989

4. Radiation damage of Ni, Al by 100KeV electrons;Muller;Phil. Mag. A.,1995

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3. Atomic-Scale Quantification of Grain Boundary Segregation in Nanocrystalline Material;Physical Review Letters;2014-03-27

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