Second-order finite element method and its practical application in charged particle optics-Reference-Cited by-同舟云学术

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Second-order finite element method and its practical application in charged particle optics

Published:1995-08 Issue:2 Volume:179 Page:170-180
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

ZHU X.,MUNRO E.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1995.tb03629.x/fullpdf

Reference12 articles.

1. Numerical analysis of electron beam lithography systems, Part III;Chu;Optik,1982

2. SURFACE PATCHES AND B-SPLINE CURVES

3. The computation of open electron lenses by coupled finite element and boundary integral methods;Lencova;Optik,1984

4. Unconventional Lens Design

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3. References;Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources;2023

4. A simulation program for electron mirrors using Boundary Element Method;Advances in Imaging and Electron Physics Including Proceedings CPO-10;2019

5. Notes and References;Principles of Electron Optics;2018

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