Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determination-Reference-Cited by-同舟云学术

Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determination

Published:2010-12-13 Issue:1 Volume:243 Page:31-39
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

PFAFF M.,MÜLLER E.,KLEIN M. F. G.,COLSMANN A.,LEMMER U.,KRZYZANEK V.,REICHELT R.,GERTHSEN D.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.2010.03475.x/fullpdf

Reference21 articles.

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