Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel-Reference-Cited by-同舟云学术

Determination of mean free path for energy loss and surface oxide film thickness using convergent beam electron diffraction and thickness mapping: a case study using Si and P91 steel

Published:2006-11 Issue:2 Volume:224 Page:187-196
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:J Microsc

Author:

MITCHELL D. R. G.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.2006.01690.x/fullpdf

Reference28 articles.

1. Foil thickness measurements from convergent-beam diffraction patterns

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3. TEM sample preparation by ion milling/amorphization

4. Methods for specimen thickness determination in electron microscopy

5. Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks

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