Resolution limits in the surface scanning electron microscope-Reference-Cited by-同舟云学术

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Resolution limits in the surface scanning electron microscope

Published:1973-08 Issue:3 Volume:98 Page:417-435
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Catto C. J. D.,Smith K. C. A.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1973.tb03844.x/fullpdf

Reference23 articles.

1. Back scattering of electrons;Archard;J. appl. Phys.,1961

2. Bishop , H.E. 1966 Electron scattering and X-ray production Ph.D. Thesis University of Cambridge

3. A new high resolution reflection scanning electron microscope;Broers;Rev. scient. Instrum.,1969

4. Catto , C.J.D. 1971 Production and storage display of the signal in the scanning electron microscope Ph.D. Thesis University of Cambridge

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