Observation of lattice fringes of the Si(111)-7×7 structure by reflection electron microscopy*-Reference-Cited by-同舟云学术

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Observation of lattice fringes of the Si(111)-7×7 structure by reflection electron microscopy*

Published:1986-05 Issue:2 Volume:142 Page:211-222
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Tanishiro Y.,Takayanagi K.,Yagi K.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1986.tb02758.x/fullpdf

Reference26 articles.

1. Domain structure of the Si(111) 2×1 surface studied by reflection electron microscopy;Bennett;J. Vac. Sci. Technol.,1985

2. An improved instrument for medium energy electron diffraction and microscopy of surfaces;Elibol;Rev. Sci. Instrum.,1985

3. Phase transformations of silicon (111) surfaces;Florio;Surface Sci.,1970

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4. Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy;Japanese Journal of Applied Physics;1999-11-15

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