Fluctuation X-ray microscopy: a novel approach for the structural study of disordered materials
Author:
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.2007.01714.x/fullpdf
Reference20 articles.
1. XANES (x ray absorption near edge structure): A new probe of higher order correlation function in amorphous semiconductors
2. XANES study of structural disorder in amorphous silicon
3. STEM imaging with a thin annular detector
4. Electron nanodiffraction methods for measuring medium-range order
5. Fluctuation microscopy – a tool for examining medium-range order in noncrystalline systems
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