1. Calibration of the H-P electron beam system;Bugely;Hewlett-Packard J.,1981
2. High resolution with STEM;Burge;Proc. 6th Europ. Congr. Electron Microsc. Jerusalem,1976
3. Catto , C.J.D. Smith , K.C.A. Nixon , W.C. Erasmus , S.J. Smith , D.J. 1981 An image pickup and display system for the Cambridge University HREM 123
4. Focusing aid for an electron microscope;Curling;Proc. IEEE.,1969
5. Automatic focus control of charged particle beams;Dost;IBM J. Res. Develop.,1968