Investigation of Annealing Induced Yttria Segregation in Sputtered Yttria-Stabilized Zirconia Thin Films-Reference-Cited by-同舟云学术

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Investigation of Annealing Induced Yttria Segregation in Sputtered Yttria-Stabilized Zirconia Thin Films

Published:2015-07-28 Issue:10 Volume:98 Page:3389-3397
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J. Am. Ceram. Soc.

Author:

Subramaniam Kiruba Mangalam¹,Rajeswara Rao Langoju Lakshmi¹,Jampana Nagaraju¹

Affiliation:

1. Department of Instrumentation and Applied Physics; Indian Institute of Science; Bangalore 560012 Karnataka India

Funder

National Nanofabrication Centre (NNFC)

Micro & Nano Characterization Facility (MNCF)

Indian Institute of Science

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jace.13777/fullpdf

Reference38 articles.

1. Colossal Ionic Conductivity at Interfaces of Epitaxial ZrO2:Y2O3/SrTiO3 Heterostructures;Barriocanal;Science,2008

2. The Effects of Substrate Surface Structure on Yttria-Stabilized Zirconia Thin Films;Jiang;Appl. Surf. Sci.,2014

3. Atomic Layer Deposition of Yttria-Stabilized Zirconia for Solid Oxide Fuel Cells;Shim;Chem. Mater.,2007

4. High Temperature Conductivity Studies on Nanoscale Yttria-Doped Zirconia Thin Films and Size Effects;Karthikeyan;Appl. Phys. Lett.,2006

5. Microstructures of YSZ and CGO Thin Films Deposited by Spray Pyrolysis: Influence of Processing Parameters on the Porosity;Scherrer;Adv. Funct. Mater.,2012

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1. Enhanced Sensing Performance of Sb-Doped Nanometer-Thin SnO₂ Films toward CO and NH₃ Gases;ACS Applied Nano Materials;2023-04-28

2. Influence of the Sputtering Technique and Thermal Annealing on YSZ Thin Films for Oxygen Sensing Applications;Coatings;2021-09-27

3. Direct observation of leakage currents in a metal–insulator–metal capacitor using in situ transmission electron microscopy;Nanotechnology;2018-08-28

4. Recent Developments in Oxide-Based Ionic Conductors: Bulk Materials, Nanoionics, and Their Memory Applications;Critical Reviews in Solid State and Materials Sciences;2016-12-20

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