Oxygen vacancy migration and impact on high voltage DC polarization in 0.8BaTiO3–0.2BiZn0.5Ti0.5O3

Author:

Bishop Sean R.1ORCID,Blea Mia A.1,Peretti Amanda S.1,Bachman William B.1,Jauregui Luis J.1,Lowry Daniel R.1ORCID,Boro Joseph1,Coker Eric N.1,Bock Jonathan A.1ORCID

Affiliation:

1. Sandia National Laboratories Albuquerque New Mexico USA

Abstract

AbstractElectrical polarization and defect transport are examined in 0.8BaTiO3–0.2BiZn0.5Ti0.5O3, an attractive capacitor material for high power electronics. Oxygen vacancies are suggested to be the majority charge carrier at or below 250°C with a grain conduction hopping activation energy of 0.97 eV and 0.92 eV for thermally stimulated depolarization current (TSDC) and impedance spectroscopy measurements, respectively. At higher temperature, thermally generated electronic conduction with an activation energy of 1.6 eV is dominant. Significant oxygen vacancy concentration is indicated (up to ∼1%) due to cation vacancy formation (i.e., acceptor defects) from observed Bi (and likely Zn) volatility. Oxygen vacancy diffusivity is estimated to be 10−12.8 cm2/s at 250°C. Low diffusivity and high activation energies are indicative of significant defect interactions. Dipolar oxygen vacancy defects are also indicated, with an activation energy of 0.59 eV from TSDC measurements. The large oxygen vacancy content leads to a short lifetime during high voltage (30 kV/cm), high temperature (250°C) direct current (DC) electrical measurements.

Publisher

Wiley

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