Calibration by differentiation – Self‐supervised calibration for X‐ray microscopy using a differentiable cone‐beam reconstruction operator-Reference-Cited by-同舟云学术

Calibration by differentiation – Self‐supervised calibration for X‐ray microscopy using a differentiable cone‐beam reconstruction operator

Published:2022-06-17 Issue:2 Volume:287 Page:81-92
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

Thies Mareike¹^ORCID,Wagner Fabian¹,Huang Yixing¹,Gu Mingxuan¹,Kling Lasse²,Pechmann Sabrina³,Aust Oliver⁴,Grüneboom Anika⁵,Schett Georg⁴⁶,Christiansen Silke²³⁷,Maier Andreas¹

Affiliation:

1. Pattern Recognition Lab Friedrich‐Alexander‐Universität Erlangen‐Nürnberg Erlangen Germany

2. Institute for Nanotechnology and Correlative Microscopy e.V. INAM Forchheim Germany

3. Fraunhofer Institute for Ceramic Technologies and Systems IKTS Forchheim Germany

4. Department of Internal Medicine 3 – Rheumatology and Immunology Friedrich‐Alexander‐Universität Erlangen‐Nürnberg and Universitätsklinikum Erlangen Erlangen Germany

5. Leibniz Institute for Analytical Sciences ISAS Dortmund Germany

6. Deutsches Zentrum für Immuntherapie Friedrich‐Alexander‐Universität Erlangen‐Nürnberg and Universitätsklinikum Erlangen Erlangen Germany

7. Physics Department Freie Universität Berlin Berlin Germany

Funder

H2020 European Research Council

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.13125

Reference50 articles.