Subsurface phase imaging of tapping‐mode atomic force microscopy at phase resonance-Reference-Cited by-同舟云学术

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Subsurface phase imaging of tapping‐mode atomic force microscopy at phase resonance

Published:2022-07-23 Issue:3 Volume:287 Page:148-155
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

Sun Baishun¹²³,Cao Liang¹³,Xie Chenchen¹³,Lu Zhengcheng⁴,Liu Mengnan¹³,Yu Miao¹³,Song Zhengxun¹³,Wen Zhankun¹³,Wang Zuobin¹³⁴^ORCID

Affiliation:

1. International Research Centre for Nano Handling and Manufacturing of China Changchun University of Science and Technology Changchun China

2. College of Medical Engineering Jilin Medical University Jilin China

3. Ministry of Education Key Laboratory for Cross‐Scale Micro and Nano Manufacturing Changchun University of Science and Technology Changchun China

4. IRAC & JR3CN University of Bedfordshire Luton UK

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.13129

Reference32 articles.

1. A simulation of atomic force microscope microcantilever in the tapping mode utilizing couple stress theory

2. Relationship between phase shift and energy dissipation in tapping-mode scanning force microscopy

3. Microcantilever dynamics in tapping mode atomic force microscopy via higher eigenmodes analysis

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