Fabric defect detection based on saliency histogram features-Reference-Cited by-同舟云学术

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Fabric defect detection based on saliency histogram features

Published:2019-04-07 Issue:3 Volume:35 Page:517-534
ISSN:0824-7935
Container-title:Computational Intelligence
language:en
Short-container-title:Computational Intelligence

Author:

Li Min¹,Wan Shaohua²^ORCID,Deng Zhongmin³,Wang Yajun⁴

Affiliation:

1. School of Mathematics and Computer ScienceWuhan Textile University Wuhan China

2. School of Information and Safety EngineeringZhongnan University of Economics and Law Wuhan China

3. School of Textile Science and EngineeringWuhan Textile University Wuhan China

4. Department of Electrical Engineering and Computer ScienceThe University of Tennessee Knoxville Tennessee

Funder

Fundamental Research Funds for the Central Universities

Publisher

Wiley

Subject

Artificial Intelligence,Computational Mathematics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/coin.12206

Reference27 articles.

1. A review of automatic fabric defect detection techniques;Mahajan PM;Advances Comput Res,2009

2. Fabric defect detection systems and methods—A systematic literature review

3. Fabric defect detection via learned dictionary-based visual saliency

4. Fabric defect detection using an integrated model of bottom‐up and top‐down visual attention;Guan SQ;J Textile Institute,2016

5. Fabric defect image segmentation based on the visual attention mechanism of the wavelet domain

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