Nanoscopic voltage distribution of operating cascade laser devices in cryogenic temperature
Author:
Affiliation:
1. Department of Electrical & Computer Engineering, Waterloo Institute for Nanotechnology; University of Waterloo; Waterloo Ontario Canada
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12356/fullpdf
Reference26 articles.
1. Two-dimensional profiling of carriers in a buried heterostructure multi-quantum-well laser: calibrated scanning spreading resistance microscopy and scanning capacitance microscopy;Ban;J. Vac. Sci. Technol. B.,2002a
2. Direct imaging of the depletion region of an InP p-n junction under bias using scanning voltage microscopy;Ban;Appl. Phys. Lett.,2002b
3. Two-dimensional transverse cross-section nanopotentiometry of actively driven buried-heterostructure multiplequantum-well lasers;Ban;J. Vac. Sci. Technol. B.,2002c
4. Scanning voltage microscopy on buried heterostructure multiquantum-well lasers: identification of a diode current leakage path;Ban;J. Quant. Electr.,2004a
5. Scanning voltage microscopy on active semiconductor lasers: the impact of doping profile near an epitaxial growth interface on series resistance;Ban;J. Quant. Electron.,2004b
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