Genome‐wide association study for spot blotch resistance in Afghan wheat germplasm

Author:

Bainsla Naresh K.1ORCID,Phuke Rahul M.2,He Xinyao3,Gupta Vikas4,Bishnoi Santosh K.4,Sharma Rajiv K.3,Ataei Najibeh5,Dreisigacker Susanne3,Juliana Philomin3,Singh Pawan K.3ORCID

Affiliation:

1. Division of Genetics ICAR‐Indian Agricultural Research Institute New Delhi India

2. ICAR‐Indian Agriculture Research Institute Indore India

3. International Maize and Wheat Improvement Center (CIMMYT) Texcoco Mexico

4. ICAR‐Indian Institute of Wheat and Barley Research Karnal India

5. Agricultural Research Institute of Afghanistan (ARIA) Ministry of Agriculture, Irrigation and Livestock (MAIL) Kabul Afghanistan

Funder

Australian Centre for International Agricultural Research

Indian Council of Agricultural Research

Publisher

Wiley

Subject

Horticulture,Plant Science,Genetics,Agronomy and Crop Science

Reference33 articles.

1. Bipolaris sorokiniana (Sacc.) Shoem.: the most destructive wheat fungal pathogen in the warmer areas;Acharya K.;Australian Journal of Crop Science,2011

2. Association Mapping of Quantitative Trait Loci in Spring Wheat Landraces Conferring Resistance to Bacterial Leaf Streak and Spot Blotch

3. Genome-wide association mapping of spot blotch resistance in wheat association mapping initiative (WAMI) panel of spring wheat (Triticum aestivum L.)

4. Alvarado G. López M. Vargas M. Pacheco A. Burguerno J.andCrossa J.(2017)META‐R (Multi Environment Trail Analysis with R for Windows) Version 6.01. CIMMYT Research Data & Software Repository Network. Available at:http://hdl.handle.net/11529/10201[Accessed 8 April 2020].

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