Association mapping of resistance to tar spot complex in maize

Author:

Yan Shufeng1ORCID,Loladze Alexander2,Wang Nan3,Sun Shuku4,Chilvers Martin I.5,Olsen Michael6,Burgueño Juan2,Petroli Cesar Daniel2,Molnar Terry2,San Vicente Felix2,Zhang Xuecai2,Prasanna Boddupalli Maruthi6

Affiliation:

1. Cereal Crops Research Institute Henan Academy of Agricultural Sciences (HAAS) Zhengzhou China

2. International Maize and Wheat Improvement Center (CIMMYT) Texcoco Mexico

3. Institute of Crop Sciences Chinese Academy of Agricultural Sciences (CAAS) Beijing China

4. Qiqihar Fuer Agronomy Incorporated Qiqihar China

5. Department of Plant, Soil and Microbial Sciences Michigan State University East Lansing Michigan USA

6. International Maize and Wheat Improvement Center (CIMMYT) Kenya World Agroforestry Centre (ICRAF) Nairobi Kenya

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Plant Science,Genetics,Agronomy and Crop Science

Reference54 articles.

1. Association mapping of days to flowering in common bean (Phaseolus vulgaris L.) revealed by DArT markers

2. Control of tar spot of maize and its effect on yield

3. Analysis of Quantitative Trait Loci for Resistance to Southern Leaf Blight in Juvenile Maize

4. Resistance to Gray Leaf Spot of Maize: Genetic Architecture and Mechanisms Elucidated through Nested Association Mapping and Near-Isogenic Line Analysis

5. Bissonnette S.(2015).Corn Disease Alert: New fungal leaf disease “Tar spot” Phyllachora maydist identified in 3 northern Illinois counties. In: The Bulletin: Pest Management and Crop Development information for Illinois. Department of Crop Sciences University [Internet]. [cited 1 Mar 2020]. Available:http://bulletin.ipm.illinois.edu/?p=3423

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